What does "C-scan" refer to in PAUT?

In the context of Phased Array Ultrasonic Testing (PAUT), "C-scan" refers to a top view representation of the test sample, where amplitudes or thickness information is mapped across the inspection area. This means that the data collected during the inspection is displayed in a two-dimensional format, allowing the operator to visualize the intensities of reflected ultrasonic signals, which correspond to the size and shape of any defects present within the material.

The C-scan provides valuable insights as it helps in identifying areas of concern by showing how signals vary across the surface. Higher amplitudes indicate potential indications such as flaws or changes in material thickness, enhancing the effectiveness of the inspection process. This type of scan is particularly helpful for making decisions about further testing, repairs, or assessing the integrity of components.

In summary, a C-scan is instrumental in defect detection and analysis since it presents data in a way that is easily interpretable, allowing for effective monitoring of material quality.